Device to test robustness of low voltage (up to 48V) electronic assemblies/systems to radiated and conducted disturbances. This includes various transients (up to +-500V) to supply lines and its coupling to signal lines. Specifically for RI 130 and CI220 tests but not limited to.
Even though this device and standard is tailored for automotive electronics, it can be greatly used for testing and validation of any electronics with extended robustness requirements.